View full size Ultra-small Strain Measurement
Self-temperature-compensation semiconductor strain gages
Applicable to Ultra-Small Strain Measurement and Highly-Sensitive Element of Transducers
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The KSN series gages use an n-type silicon for the resistive element to control the resistance temperature coefficient of the material according to the linear expansion coefficient of the measuring object. Thus, thermally-induced resistance change is minimized.
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| KSN-2-120-E4 | KSN-2-120-E5 | KSN-2-120-F3 |
| PC-12B | －50～150℃ |
| CC-33A | －50～120℃ |
| CC-36 | －10～100℃ |
| EP-17 | －50～150℃ （Applicable only for E5 type） |
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Digital Oscilloscope
